Tuesday, May 25, 2010

MOSFET picture clarified


Maybe this will help clarify some of the issues that came up in today's class. This focuses on the nature of a metal-oxide-semiconductor(p-doped) sandwich, where-in the chemical potentials of the metal and doped semiconductor are perfectly aligned. In the left-hand picture the voltage is zero. If you apply a positive voltage, that leads to depletion in the p-doped semiconductor (center picture). All the equations pertain to the center illustration and to the use a a depletion ansatz for that case. It is interested to see how the applied voltage, V, influences the depletion width, $z_0$, and the band bending, $\Delta \Phi$.

Looking at these relationships, which seem pretty understandable, i am thinking we should have started with this simpler zero chemical potential difference case. For extra-credit, who can figure out/ calculate how a higher chemical ptential in the metal would effect the equations for the depletion width and $\Delta \Phi$.

3 comments:

  1. PS. The vertical scale is meant to be related through the sequence of 3 pictures. Notice how the chemical potential on the far right side of the semiconductor in each picture is the same. What does that mean?

    Also, how/why does a positive voltage correspond to the chemical potential of the metal going down??

    ReplyDelete
  2. Applying a positive voltage across the junction causes the metal side to have a more positive charge and the semiconductor side to have a more negative charge, since this is the charge distribution that corresponds to a positive voltage. This charge imbalance comes from a migration of electrons from the metal to the semiconductor (or, equally valid, a migration of holes from the semiconductor to the metal). For a metal, the chemical potential or Fermi surface is the highest occupied orbital. If there are fewer electrons, fewer orbitals will be occupied. The chemical potential is therefore lower.

    ReplyDelete
  3. So Zack and I were discussing the relationship between applied voltage and the
    corresponding shift in the bands for a MOS capacitor that starts off with
    $\mu_{metal} = \mu_{semi}$. He worked out a formula for this, making the
    depletion approximation (ie, the assumption that the charge that builds up in
    the semiconductor forms a square well of sorts--we're ignoring the exponential
    increase in the n-carriers near the semiconductor oxide boundary). The result,
    as posted earlier, is:

    $\Delta \phi = \frac{\epsilon_{oxide}^2V^2}{2\epsilon_{semi}eN_aW_{oxide}^2}$.

    Here, $\epsilon_{oxide}$ and $\epsilon_{semi}$ are the electrical permitivities
    for the oxide and semiconductor, which are 3.9$\epsilon_0$ and 12$\epsilon_0$
    respectively. $N_a$ is the number of acceptors; we assumed $10^{17}$cm$^{-3}$.
    $W_{oxide}$ is the thickness of the oxide--we assumed 20nm. V is the applied
    voltage and $\Delta \phi$ is the amount of band bending that occurs.

    We can look at this formula another way, introducing the variable $V_c$:

    $\Delta \phi = \frac{V}{V_c}V$, where $V_c =
    \frac{2\epsilon_{semi}eN_aW_{oxide}^2}{\epsilon_{oxide}}$. When we plug in the
    numbers (and please, check our results think them unreasonable), we find $V_c =
    0.54V$.

    So, $V_c$ is an energy scale we can use to gauge how much $\Delta \phi$ depends
    on the applied voltage $V$. However, remember that this is only valid for
    small applied voltages, when the depletion approximation remains valid.

    ReplyDelete